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71
Spectroscopic Measurenent of Dα, CII, CIII and CD Emissions in Heliotron J Carbon Test Limiter Experiment
Spectroscopic Measurenent of Dα, CII, CIII and CD Emissions in Heliotron J Carbon Test Limiter Experiment
H. Arimoto, | 한국물리학회 | 2006 ,
72
Scanning force Microscopy of Relaxor Ferroelectric PbMg⅓Nb⅔O₃-PbTiO₃Thin films for Piezoelectric Sensors
Scanning force Microscopy of Relaxor Ferroelectric PbMg⅓Nb⅔O₃-PbTiO₃Thin films for Piezoelectric Sensors
J. H. Lee, | 한국물리학회 | 2007 ,
73
Breakdown Voltage Characteristics of SiC Schottky Barrier Diode with Aluminum Depositon Edge Termination Structure
Breakdown Voltage Characteristics of SiC Schottky Barrier Diode with Aluminum Depositon Edge Termination Structure
Seong-Jin Kim, | 한국물리학회 | 2007 ,
74
Dielectric Properties of Amorphous KNbXO5(X=Ge, Si)
Dielectric Properties of Amorphous KNbXO5(X=Ge, Si)
Chul Ho Song, | 한국물리학회 | 2007 ,
75
An Analysis of Boundary Effects of Regionally Applied Modified Illumination with DOE at the Back Surface of a Photomask
An Analysis of Boundary Effects of Regionally Applied Modified Illumination with DOE at the Back Surface of a Photomask
Woo-Jung Kim, | 한국물리학회 | 2007 ,
76
Phase Transition Characteristics of Nitrogen-Doped Antimony-Telluride (N-Sb₂Te₃) Thin Films for a Phase Change Random Access Memory
Phase Transition Characteristics of Nitrogen-Doped Antimony-Telluride (N-Sb₂Te₃) Thin Films for a Phase Change Random Access Memory
Jin Ho Oh, | 한국물리학회 | 2006 ,
77
Improved Performance of Organic Light-Emitting Diodes Using a Zn Complex
Improved Performance of Organic Light-Emitting Diodes Using a Zn Complex
Yoon-Ki Jang, | 한국물리학회 | 2006 ,
78
Influence of High Temperature Annealing on the Magnetic and the Structural Properties of Co Ion-Implanted ZnO Single Crystals
Influence of High Temperature Annealing on the Magnetic and the Structural Properties of Co Ion-Implanted ZnO Single Crystals
Woochul Kim, | 한국물리학회 | 2006 ,
79
Anisotropic X-ray Rocking Curve Due to a Damaged Surface Layer in a Freestanding GaN Thick Film
Anisotropic X-ray Rocking Curve Due to a Damaged Surface Layer in a Freestanding GaN Thick Film
S. H. Park, | 한국물리학회 | 2006 ,
80
Structural Properties of CrN Buffers for GaN Growth
Structural Properties of CrN Buffers for GaN Growth
W. H. Lee, | 한국물리학회 | 2006 ,
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