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691
Examination of Gaussian-Type Basis Sets on Alkali Metal Iodides
Examination of Gaussian-Type Basis Sets on Alkali Metal Iodides
Kim Chang Kon, | 대한화학회 | 2006 ,
692
A New Fabrication Method of Aluminum Nanotube Using Anodic Porous Alumina Film as a Template
A New Fabrication Method of Aluminum Nanotube Using Anodic Porous Alumina Film as a Template
Sung Dae Dong, | 대한화학회 | 2006 ,
693
Methanol Oxidation Effect on Carbon Supported Pt Particles Studied by ¹³C NMR, XRD, and TEM
Methanol Oxidation Effect on Carbon Supported Pt Particles Studied by ¹³C NMR, XRD, and TEM
Han Kee Sung, | 대한화학회 | 2006 ,
694
Dielection Properties of PZT(20/80)/PZT(80/20)Heterolatered Thick Films Fabricated by Screen-printing Method
Dielection Properties of PZT(20/80)/PZT(80/20)Heterolatered Thick Films Fabricated by Screen-printing Method
Sung-Gap Lee, | 한국전기전자재료학회 | 2006 ,
695
Application of Potential-pH Diagram and Potentiodynamic Polarization of Tungsten
Application of Potential-pH Diagram and Potentiodynamic Polarization of Tungsten
Yong-Jin Seo, | 한국전기전자재료학회 | 2006 ,
696
Preparation and Characterization of Screen-printed Leda Zirconate Titanate Thick Films
Preparation and Characterization of Screen-printed Leda Zirconate Titanate Thick Films
Sung-Gap Lee, | 한국전기전자재료학회 | 2006 ,
697
Electrical Characteristics of Single-silicon TFT Structure with Symmetric Dual-gate for Kink Effect Suppression
Electrical Characteristics of Single-silicon TFT Structure with Symmetric Dual-gate for Kink Effect Suppression
Ey Goo Kang, | 한국전기전자재료학회 | 2006 ,
698
Collapsing exchange rate regime : a theoretical and empirical investigation with special reference to Korea
Collapsing exchange rate regime : a theoretical and empirical investigation with special reference to Korea
Sim, Sung-Hoon, 327.94-S588c-TD | University of Oklahoma | 1999 327.94-S588c-TD,
699
Microbial degradation of munttion wastes by mixed and singe species culture
Microbial degradation of munttion wastes by mixed and singe species culture
Kwon Sung-Hyun, 539.9-K98m-TD | University of Southern California | 1997 539.9-K98m-TD,
700
(CMOS) Digital integrated circuits : analysis and design
(CMOS) Digital integrated circuits : analysis and design
Kang, Sung Mo, 569.8-K16d | McGraw-Hill | 1996 569.8-K16d,
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