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691
The Effect of Legal Environment on Voluntary Disclosure : Evidence from Management Earnings Forecasts Issued in U.S. and Canadian Markets
The Effect of Legal Environment on Voluntary Disclosure : Evidence from Management Earnings Forecasts Issued in U.S. and Canadian Markets
Baginski, S. P., | American Accounting Assn | 2002 ,
692
Regular Paper : A Study on Electro-optical Characteristics of the UV Aligned FFS Cell on the Organic Layer
Regular Paper : A Study on Electro-optical Characteristics of the UV Aligned FFS Cell on the Organic Layer
Jeong Min Han, | 한국전기전자재료학회 | 2008 ,
693
Regular Paper : Preparation and Luminescence Properties of PDP Green Phosphors using Polymer Matrix Technique
Regular Paper : Preparation and Luminescence Properties of PDP Green Phosphors using Polymer Matrix Technique
Sang Bae Jun, | 한국전기전자재료학회 | 2008 ,
694
Regular Paper : Electrical and Optical Properties of ITO Films Sputtered by RF-bias Voltage and In-Sn Alloy Target
Regular Paper : Electrical and Optical Properties of ITO Films Sputtered by RF-bias Voltage and In-Sn Alloy Target
Hyun Hoo Kim, | 한국전기전자재료학회 | 2005 ,
695
Regular Paper : An Investigation of Locally Trapped Charge Distribution using the Charge Pumping Method in the Two-bit SONOS Cell
Regular Paper : An Investigation of Locally Trapped Charge Distribution using the Charge Pumping Method in the Two-bit SONOS Cell
Ho Myoung An, | 한국전기전자재료학회 | 2005 ,
696
Regular Paper : Nature of Surface and Bulk Defects Induced by Epitaxial Growth in Epitaxial Layer Transfer Wafers
Regular Paper : Nature of Surface and Bulk Defects Induced by Epitaxial Growth in Epitaxial Layer Transfer Wafers
Suk Goo Kim, | 한국전기전자재료학회 | 2005 ,
697
Regular Paper : Wafer Burn-in Method of SRAM for Multi Chip Package
Regular Paper : Wafer Burn-in Method of SRAM for Multi Chip Package
Hoo Sung Kim, | 한국전기전자재료학회 | 2005 ,
698
Regular Paper : X-ray Sensitivity of Hybrid-type Sensor based on CaWO4-Selenium for Digital X-ray Imager
Regular Paper : X-ray Sensitivity of Hybrid-type Sensor based on CaWO4-Selenium for Digital X-ray Imager
Ji Koon Park, | 한국전기전자재료학회 | 2005 ,
699
Regular Paper : The Analysis of Electrothermal Conductivity Characteristics for SOI(SOS) LIGBT with latch-up
Regular Paper : The Analysis of Electrothermal Conductivity Characteristics for SOI(SOS) LIGBT with latch-up
Je Yoon Kim, | 한국전기전자재료학회 | 2005 ,
700
Articles : Consolidating the Authoritarian Developmental State in the 1970s Korea: Chosen Strategies
Articles : Consolidating the Authoritarian Developmental State in the 1970s Korea: Chosen Strategies
Soon Yang Kim, | 한국행정학회 | 2007 ,
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