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833 Results:AA:M H CHO 0.374 sec.
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431
Domain Switching of Ferroelectric Thin Films by Using a Scanning Probe Microscope
Domain Switching of Ferroelectric Thin Films by Using a Scanning Probe Microscope
J. Y. Son, | 한국물리학회 | 2007 ,
432
Post-RTA Effect on the Electrical Characteristics of Nano-Scale Strained Si Grown on SiGe-on-Insulator n-MOSFET
Post-RTA Effect on the Electrical Characteristics of Nano-Scale Strained Si Grown on SiGe-on-Insulator n-MOSFET
Seong-Je Kim, | 한국물리학회 | 2007 ,
433
A Study on the Absorption Properties of EM Wave Absorbers Using Carbon
A Study on the Absorption Properties of EM Wave Absorbers Using Carbon
Chang Mook Choi, | 한국물리학회 | 2007 ,
434
Measurement of Isomeric Cross-Section Ratios for the 45Sc(γ,n)44m.gSc, natTi(γ, χ)44m.gSc, 103Rh(γ,4n)99m,gRh, and natFe(γ, χ)52m,gMn Reactions Induced by 65-MeV Bremsstrahlung
Measurement of Isomeric Cross-Section Ratios for the 45Sc(γ,n)44m.gSc, natTi(γ, χ)44m.gSc, 103Rh(γ,4n)99m,gRh, and natFe(γ, χ)52m,gMn Reactions Induced by 65-MeV Bremsstrahlung
Van Do Nguyen, | 한국물리학회 | 2007 ,
435
Time-Resolved Observation of Carbon Nanotube Growth by Using an Environmental TEM
Time-Resolved Observation of Carbon Nanotube Growth by Using an Environmental TEM
Cheol-Woong Yang, | 한국물리학회 | 2007 ,
436
Effect of Fe Doping on Ferroelectric and Ferromagne Properties of SrBaNbFeO Ceramics
Effect of Fe Doping on Ferroelectric and Ferromagne Properties of SrBaNbFeO Ceramics
Sung Yong Cho, | 한국물리학회 | 2007 ,
437
Examination of Current-Induced magnetic Field in the Slab Geometry : Possible Origin of Spin Hall Effect
Examination of Current-Induced magnetic Field in the Slab Geometry : Possible Origin of Spin Hall Effect
B. Abdullaev, | 한국물리학회 | 2007 ,
438
EPIR Effect of Planar RRAM Device Using Pr0.7Ca0.3MnO₃/SrTiO₃(100) Thin Film
EPIR Effect of Planar RRAM Device Using Pr0.7Ca0.3MnO₃/SrTiO₃(100) Thin Film
H. B. Moon, | 한국물리학회 | 2007 ,
439
Electrical Properties of Epitaxial Pr0.7Ca0.3MnO₃Thin Films
Electrical Properties of Epitaxial Pr0.7Ca0.3MnO₃Thin Films
H. B. Moon, | 한국물리학회 | 2007 ,
440
Photoluminescence Characterization of Dependence of Si-Nanocrystals Formation in Si-Rich Sioχ on Thickness. Oxygen Content, and the Existence of a SiO₂ Cap Layer
Photoluminescence Characterization of Dependence of Si-Nanocrystals Formation in Si-Rich Sioχ on Thickness. Oxygen Content, and the Existence of a SiO₂ Cap Layer
Min Choul Kim, | 한국물리학회 | 2007 ,
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