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351
The Effect of Yttrium Oxide on the sintering Behavior and Hardness of Tungsten
The Effect of Yttrium Oxide on the sintering Behavior and Hardness of Tungsten
Youngmoo Kim, | 대한금속재료학회 | 2006 ,
352
Homeotropic Liquid Crystal Alignment Effect Using a Fluorinated Diamond-Like Carbon Film
Homeotropic Liquid Crystal Alignment Effect Using a Fluorinated Diamond-Like Carbon Film
Han Jin Ahn, | 대한금속재료학회 | 2005 ,
353
Low Dielectric Constant Organic-Inorganic Hybrid Materials by Non-Hydrolytic Sol-Gel Method
Low Dielectric Constant Organic-Inorganic Hybrid Materials by Non-Hydrolytic Sol-Gel Method
Chaungi Hoi, | 대한금속재료학회 | 2005 ,
354
Room-Temperature Ferromagnetic Behavior of Homoepitaxia1 Mn-Doped Si Thin Films Grown by Laser Molecular-Beam Epitaxy
Room-Temperature Ferromagnetic Behavior of Homoepitaxia1 Mn-Doped Si Thin Films Grown by Laser Molecular-Beam Epitaxy
Sug Woo Jung, | 대한금속재료학회 | 2005 ,
355
In-Situ Magneto-Optical Kerr Effect Studies of Exchange-Bias Formations in Ferromagnetic/Antiferromagnetic Thin Film Systems
In-Situ Magneto-Optical Kerr Effect Studies of Exchange-Bias Formations in Ferromagnetic/Antiferromagnetic Thin Film Systems
Young-Sang Yu, | 대한금속재료학회 | 2005 ,
356
Kinetic Characteristics of FCC to Hexagonal Transformation in (Ge₁Sb₂Te₄)0.8(Sn₁Bi₂Te₄)0.2 Chalcogenide Alloy for PhaseChange Memory
Kinetic Characteristics of FCC to Hexagonal Transformation in (Ge₁Sb₂Te₄)0.8(Sn₁Bi₂Te₄)0.2 Chalcogenide Alloy for PhaseChange Memory
Dong-Ho Ahn, | 대한금속재료학회 | 2005 ,
357
Schottky Barrier Metal-Oxide-Semiconductor Field-Effect Transistors for NAno-Regime Applications
Schottky Barrier Metal-Oxide-Semiconductor Field-Effect Transistors for NAno-Regime Applications
Seongjae Lee, | 대한금속재료학회 | 2005 ,
358
Characteristics of Mo Based Alloys for Advanced Dual Metal Electrode Applications
Characteristics of Mo Based Alloys for Advanced Dual Metal Electrode Applications
Taekwan Oh, | 대한금속재료학회 | 2005 ,
359
Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)
Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)
Hyungjung Shin, | 대한금속재료학회 | 2005 ,
360
Realization of p-Type ZnO Using Zn₃As₂and Zn₃P₂as Doping Source
Realization of p-Type ZnO Using Zn₃As₂and Zn₃P₂as Doping Source
Veeramuthu Vaithianathan, | 대한금속재료학회 | 2005 ,
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Helsinki Monitor
Martinus Nijhoff [, ]