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321
Fault Detection, Diagnosis, and Optimization of Wafer Manufacturing Processes utilizing Knowledge Creation
Fault Detection, Diagnosis, and Optimization of Wafer Manufacturing Processes utilizing Knowledge Creation
Hyeon Bae, | 제어자동화시스템공학회 | 2006 ,
322
Camera Imaging Lens Fabrication using Wafer-Scale UV Embossing Process
Camera Imaging Lens Fabrication using Wafer-Scale UV Embossing Process
Ho-Seop Jeong, | 한국광학회 | 2006 ,
323
Direct Epipolar Image Generation From Ikonos Stereo Imagery Based On RPC and Parallel Projection Model
Direct Epipolar Image Generation From Ikonos Stereo Imagery Based On RPC and Parallel Projection Model
Jaehong Oh, | 대한원격탐사학회 | 2006 ,
324
Control Method for the Tool Path in Aspherical Surface Grinding and Polishing
Control Method for the Tool Path in Aspherical Surface Grinding and Polishing
Hyung-Tae Kim., | 한국정밀공학회 | 2006 ,
325
Rapid Manufacturing of 3D Micro-products using UV Laser Ablation and Phase-change Filling
Rapid Manufacturing of 3D Micro-products using UV Laser Ablation and Phase-change Filling
Bo Sung Shin., | 한국정밀공학회 | 2006 ,
326
Differential Space Time Coding based on Different Unitary Matrices Sets
Differential Space Time Coding based on Different Unitary Matrices Sets
Kwang-Jae Lee., | 한국전자파학회 | 2006 ,
327
Electro-optical Characterization of OLED Device
Electro-optical Characterization of OLED Device
Soon-Seok Lee., | 한국콘텐츠학회 | 2006 ,
328
Use of a MOSFET for Radiation Monitoring in Space and Comparison with the NASA Trapped Particle Model
Use of a MOSFET for Radiation Monitoring in Space and Comparison with the NASA Trapped Particle Model
Sung-Joon KIM, | 한국물리학회 | 2006 ,
329
Magnetic, Structural, and Electrical Properties of Si1-xMnx Single Crystals
Magnetic, Structural, and Electrical Properties of Si1-xMnx Single Crystals
Younghun HWANG, | 한국물리학회 | 2006 ,
330
Error Analysis of the Pefp RFQ
Error Analysis of the Pefp RFQ
Hyeok Jung Kwon, | 한국물리학회 | 2006 ,
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