본문

  1. Home
596 Results:AA:C S HAN 0.281 sec.
RSS 
다국어입력
 상세검색
 신착검색
선택출력 선택엑셀내보내기
171
Ab initio and Vibrational Predissociation Studies on Methylammonium-(Water)4 Complex: Evidence for Multiple Cyclic and Non-cyclic Hydrogen-bonded Structures
Ab initio and Vibrational Predissociation Studies on Methylammonium-(Water)4 Complex: Evidence for Multiple Cyclic and Non-cyclic Hydrogen-bonded Structures
Kwang-Yon Kim, | 대한화학회 | 2006 ,
172
1 Gb/s gated-oscillator burst mode CDR for half-rate clock recovery
1 Gb/s gated-oscillator burst mode CDR for half-rate clock recovery
Pyung-su Han, | 대한전자공학회 | 2004 ,
173
Development of Embedded Non-Volatile FRAMs for High Performance Smart Cards
Development of Embedded Non-Volatile FRAMs for High Performance Smart Cards
Kang-Woon Lee, | 대한전자공학회 | 2004 ,
174
Simulation of Piezoelectric Dome-Shaped-Diaphragm Acoustic Transducers
Simulation of Piezoelectric Dome-Shaped-Diaphragm Acoustic Transducers
Cheol-Hyun Han, | 대한전자공학회 | 2005 ,
175
Device Characteristics of A1GaN/GaN MIS-HFET using A12O3 Based High-k Dielectric
Device Characteristics of A1GaN/GaN MIS-HFET using A12O3 Based High-k Dielectric
Ki-Yeol Park, | 대한전자공학회 | 2005 ,
176
Quantitative Analysis on Voltage Schemes for Reliable Operations of a Floating Gate Type Double Gate Nonvolatile Memory Cell
Quantitative Analysis on Voltage Schemes for Reliable Operations of a Floating Gate Type Double Gate Nonvolatile Memory Cell
Seongjae Cho, | 대한전자공학회 | 2005 ,
177
Fabrication Uncertainty and Noise Issues in high-Precision MEMS Actuators and Sensors
Fabrication Uncertainty and Noise Issues in high-Precision MEMS Actuators and Sensors
Young-Ho Cho, | 대한전자공학회 | 2002 ,
178
On-chip Smart Functions for Efficiency Enhancement of MMIC Power Amplifiers for W-CDMA Handset Applications
On-chip Smart Functions for Efficiency Enhancement of MMIC Power Amplifiers for W-CDMA Handset Applications
Youn S. Noh, | 대한전자공학회 | 2003 ,
179
Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism
Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism
Chih Hang Tung, | 대한전자공학회 | 2003 ,
180
Design Consideration of Body-Tied FinFETs(\{Omega}MOSFETs) Implemented on Bulk Si Wafers
Design Consideration of Body-Tied FinFETs(\{Omega}MOSFETs) Implemented on Bulk Si Wafers
Kyoung-Rok Han, | 대한전자공학회 | 2004 ,
처음이전13141516171819202122이후마지막