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151
Comparative Expression and Characterization of Dehydroascorbate Reductase cDNA from Transformed Sesame Hairy Roots using Real-Time RT-PCR
Comparative Expression and Characterization of Dehydroascorbate Reductase cDNA from Transformed Sesame Hairy Roots using Real-Time RT-PCR
Jae An Chun, | 한국식물학회(Adventitous Root Formation | 2006 ,
152
Rapid Upregulation of Dehyrin3 and Dehydrin4 in Response to Dehydration Is a Characteristic of Drought-Tolerant Genotypes in Barley
Rapid Upregulation of Dehyrin3 and Dehydrin4 in Response to Dehydration Is a Characteristic of Drought-Tolerant Genotypes in Barley
So Yon Park, | 한국식물학회(Adventitous Root Formation | 2006 ,
153
The Electrical Improvement of PZT Thin Films Etched into CF4/(Cl2+Ar) Plasma
The Electrical Improvement of PZT Thin Films Etched into CF4/(Cl2+Ar) Plasma
Seong Mo Koo, | 한국전기전자재료학회 | 2005 ,
154
The Electrical Properties of Aluminum Bipolar Plate for PEM Fuel Cell System
The Electrical Properties of Aluminum Bipolar Plate for PEM Fuel Cell System
Mee Hye Oh, | 한국전기전자재료학회 | 2005 ,
155
PZT-PMN Ceramics for Large Displacement Piezoelectric Devices
PZT-PMN Ceramics for Large Displacement Piezoelectric Devices
Kee Joe Lim, | 한국전기전자재료학회 | 2005 ,
156
A CMOS Bandgap Reference Voltage Generator for a CMOS Active Pixel Sensor Imager
A CMOS Bandgap Reference Voltage Generator for a CMOS Active Pixel Sensor Imager
Kwang Hyun Kim, | 한국전기전자재료학회 | 2005 ,
157
Investigation of the Alignment Phenomena on the a-C:H Thin Films by PECVD System using Ion-beam Alignment Method
Investigation of the Alignment Phenomena on the a-C:H Thin Films by PECVD System using Ion-beam Alignment Method
Chang Joon Park, | 한국전기전자재료학회 | 2005 ,
158
A Study on the Corrosion Effects by Addition of Complexing Agent in the Copper CMP Process
A Study on the Corrosion Effects by Addition of Complexing Agent in the Copper CMP Process
Sang Yong Kim, | 한국전기전자재료학회 | 2004 ,
159
EO Characteristic of the In-plane Driven VA Cells on a Polymer Layer
EO Characteristic of the In-plane Driven VA Cells on a Polymer Layer
Sang Keuk Lee, | 한국전기전자재료학회 | 2004 ,
160
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Jeon Ho Kim, | 한국전기전자재료학회 | 2004 ,
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