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151
Ectopic Overexpression of the Hot Pepper Cat1 in Arabidopsis Enhances Resistance to Paraquat, but not to Wounding
Ectopic Overexpression of the Hot Pepper Cat1 in Arabidopsis Enhances Resistance to Paraquat, but not to Wounding
Sang Ho Lee, | 한국식물학회(Adventitous Root Formation | 2006 ,
152
The Study on the Characteristic of Phase Transition in Differential Thickness of Se1Sb2Se2 Thin Films
The Study on the Characteristic of Phase Transition in Differential Thickness of Se1Sb2Se2 Thin Films
Jae Min Lee, | 한국전기전자재료학회 | 2005 ,
153
The Elimination Characteristics by Impressed Voltage of Holography Grating in Chacogenide Thin Film
The Elimination Characteristics by Impressed Voltage of Holography Grating in Chacogenide Thin Film
Ki Nam Lee, | 한국전기전자재료학회 | 2005 ,
154
The Phase Transition with Electric Field in Ternary Chalcogenide Thin Films
The Phase Transition with Electric Field in Ternary Chalcogenide Thin Films
Sung Jun Yang, | 한국전기전자재료학회 | 2005 ,
155
Effect of the Coating on the Structure and Optical Properties of GaN Nanowires
Effect of the Coating on the Structure and Optical Properties of GaN Nanowires
Jong Soo Lee, | 한국전기전자재료학회 | 2005 ,
156
Plasma Characterization of Facing Target Sputter System for Carbon Nitride Film Deposition
Plasma Characterization of Facing Target Sputter System for Carbon Nitride Film Deposition
Ji Gong Lee, | 한국전기전자재료학회 | 2005 ,
157
Structural and Optoelectronic Properties of SnO2 Nanowires
Structural and Optoelectronic Properties of SnO2 Nanowires
Jong Soo Lee, | 한국전기전자재료학회 | 2005 ,
158
Eu-doped LGF Luminescent Down Converter Possible for TiO2 Dye Sensitized Solar Cells
Eu-doped LGF Luminescent Down Converter Possible for TiO2 Dye Sensitized Solar Cells
Hyun Ju Kim, | 한국전기전자재료학회 | 2005 ,
159
The Study of Phase-change with Temperature and Electric field in Chalcogenide Thin Film
The Study of Phase-change with Temperature and Electric field in Chalcogenide Thin Film
Sung Jun Yang, | 한국전기전자재료학회 | 2004 ,
160
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Jeon Ho Kim, | 한국전기전자재료학회 | 2004 ,
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