본문

  1. Home
516 Results:AA:Y CHU 0.266 sec.
RSS 
다국어입력
 상세검색
 신착검색
선택출력 선택엑셀내보내기
121
The Study on the Characteristic of Phase Transition in Differential Thickness of Se1Sb2Se2 Thin Films
The Study on the Characteristic of Phase Transition in Differential Thickness of Se1Sb2Se2 Thin Films
Jae Min Lee, | 한국전기전자재료학회 | 2005 ,
122
The Elimination Characteristics by Impressed Voltage of Holography Grating in Chacogenide Thin Film
The Elimination Characteristics by Impressed Voltage of Holography Grating in Chacogenide Thin Film
Ki Nam Lee, | 한국전기전자재료학회 | 2005 ,
123
The Phase Transition with Electric Field in Ternary Chalcogenide Thin Films
The Phase Transition with Electric Field in Ternary Chalcogenide Thin Films
Sung Jun Yang, | 한국전기전자재료학회 | 2005 ,
124
Effect of CuO on the Low Temperature Sintering Properties of PSN-PNN-PZT Ceramics
Effect of CuO on the Low Temperature Sintering Properties of PSN-PNN-PZT Ceramics
Yeong Ho Jeong, | 한국전기전자재료학회 | 2005 ,
125
2-Dimensional Holographic Grating Formation in Chalcogenide Thin Films
2-Dimensional Holographic Grating Formation in Chalcogenide Thin Films
Jung Tae Lee, | 한국전기전자재료학회 | 2005 ,
126
A Study on the Corrosion Effects by Addition of Complexing Agent in the Copper CMP Process
A Study on the Corrosion Effects by Addition of Complexing Agent in the Copper CMP Process
Sang Yong Kim, | 한국전기전자재료학회 | 2004 ,
127
The Study of Phase-change with Temperature and Electric field in Chalcogenide Thin Film
The Study of Phase-change with Temperature and Electric field in Chalcogenide Thin Film
Sung Jun Yang, | 한국전기전자재료학회 | 2004 ,
128
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Thermal Stability and Electrical Properties of HfOxNy, Gate Dielectrics with TaN Gate Electrode
Jeon Ho Kim, | 한국전기전자재료학회 | 2004 ,
129
Preparation of Low-Temperature Fired PZT Thick Films on Si by Screen Printing
Preparation of Low-Temperature Fired PZT Thick Films on Si by Screen Printing
Chae Il Cheon, | 한국전기전자재료학회 | 2004 ,
130
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Surface Analysis of Plasma-treated PDMS by XPS and Surface Voltage Decay
Bok Hee Youn, | 한국전기전자재료학회 | 2003 ,
처음이전891011121314151617이후마지막