본문

  1. Home
2 Results:SS:WIDTHS 0.124 sec.
RSS 
Multilingual
 การค้นหาขั้นสูง
 เดินทางมาถึงค้นหาวัสดุใหม่
พิมพ์ที่เลือก Select Export to Excel
1
Mask Error Enhancement Factor Variation with Pattern Density for 65 nm and 90 nm Line Widths
Mask Error Enhancement Factor Variation with Pattern Density for 65 nm and 90 nm Line Widths
Kang, Hye-young, | 한국물리학회 | 2006 ,
2
A method for effective beam widths of slabs in flat plate structures under gravity and lateral loads
A method for effective beam widths of slabs in flat plate structures under gravity and lateral loads
Jung-Wook Choi, Jin-Gyu Song, | 국제구조공학회(TECNO-PRESS) | 2005 ,
처음1마지막