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A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy.
A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy.
Detailed Information
- 자료유형
- 기사
- ISSN
- 10636536
- 저자명
- Abu Sebastian
- 서명/저자
- A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy. / Abu Sebastian , Anil Gannepalli, Murti V. Salapaka
- 발행사항
- New York, NY : Institute of Electrical and Electronics Engineers, 2007.
- 형태사항
- pp. 952-959
- 주기사항
- Indudes Bibiography Reference
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60263533
MARC
008201016s2007 ai aa eng■022 ▼a10636536
■1001 ▼aAbu Sebastian
■24510▼aA Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy.▼dAbu Sebastian▼eAnil Gannepalli, Murti V. Salapaka
■260 ▼aNew York, NY▼bInstitute of Electrical and Electronics Engineers▼c2007.
■300 ▼app. 952-959
■500 ▼aIndudes Bibiography Reference
■7001 ▼aAnil Gannepalli, Murti V. Salapaka
■773 ▼tIEEE transactions on control systems technology▼gVol. 15 No. 5 (2007. 9)▼d2007, 09
■SIS ▼aS042034▼b60077650▼h8▼s2▼fP
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