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Fault residual generation via nonlinear analytical redundancy
Fault residual generation via nonlinear analytical redundancy
Detailed Information
- 자료유형
- 기사
- ISSN
- 10636536
- 서명/저자
- Fault residual generation via nonlinear analytical redundancy / Martin L. Leuschen , Ian D. Walker, Joseph R. Cavallaro
- 발행사항
- New York, NY : Institute of Electrical and Electronics Engineers, 2005.
- 형태사항
- pp. 452-458
- 주기사항
- Indudes Bibiography Reference
- 원문정보
- url
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60263345
MARC
008201016s2005 ai aa eng■022 ▼a10636536
■1001 ▼aMartin L. Leuschen
■24510▼aFault residual generation via nonlinear analytical redundancy▼dMartin L. Leuschen▼eIan D. Walker, Joseph R. Cavallaro
■260 ▼aNew York, NY▼bInstitute of Electrical and Electronics Engineers▼c2005.
■300 ▼app. 452-458
■500 ▼aIndudes Bibiography Reference
■7001 ▼aIan D. Walker, Joseph R. Cavallaro
■773 ▼tIEEE transactions on control systems technology▼gVol. 13 No. 3 (2005. 5)▼d2005, 05
■856 ▼uhttps://www.ieee.org
■SIS ▼aS029544▼b60077650▼h8▼s2▼fP
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