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Ordinary and neural Chi-squared tests for fault detection in multi-output stochastic systems
Ordinary and neural Chi-squared tests for fault detection in multi-output stochastic systems
Detailed Information
- 자료유형
- 기사
- ISSN
- 10636536
- 서명/저자
- Ordinary and neural Chi-squared tests for fault detection in multi-output stochastic systems / Fahmida N. Chowdhury
- 발행사항
- New York, NY : Institute of Electrical and Electronics Engineers, 2000.
- 형태사항
- pp. 372-379
- 주기사항
- Indudes Bibiography Reference
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60262944
MARC
008201015s2000 ai aa eng■022 ▼a10636536
■1001 ▼aFahmida N. Chowdhury
■24510▼aOrdinary and neural Chi-squared tests for fault detection in multi-output stochastic systems▼dFahmida N. Chowdhury
■260 ▼aNew York, NY▼bInstitute of Electrical and Electronics Engineers▼c2000.
■300 ▼app. 372-379
■500 ▼aIndudes Bibiography Reference
■773 ▼tIEEE transactions on control systems technology▼gVol. 8 No. 2 (2000. 3)▼d2000, 03
■SIS ▼aS029513▼b60077650▼h8▼s2▼fP
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