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Application of dual-rate modeling to CCR octane quality inferential control
Application of dual-rate modeling to CCR octane quality inferential control
Detailed Information
- Material Type
- 기사
- ISSN
- 10636536
- Author
- Dongguang Li
- Title/Author
- Application of dual-rate modeling to CCR octane quality inferential control / Dongguang Li ; Sirish L. Shah, Tongwen Chen, Kent Z. Qi
- Publish Info
- New York, NY : Institute of Electrical and Electronics Engineers, 2003.
- Material Info
- pp. 43-51
- General Note
- Includes Bibliography Reference
- Added Entry-Personal Name
- Sirish L. Shah, Tongwen Chen, Kent Z. Qi
- Electronic Location and Access
- url
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60262844
MARC
008201015s2003 ai aa eng■022 ▼a10636536
■1001 ▼aDongguang Li
■24510▼aApplication of dual-rate modeling to CCR octane quality inferential control▼dDongguang Li▼eSirish L. Shah, Tongwen Chen, Kent Z. Qi
■260 ▼aNew York, NY▼bInstitute of Electrical and Electronics Engineers▼c2003.
■300 ▼app. 43-51
■500 ▼aIncludes Bibliography Reference
■7001 ▼aSirish L. Shah, Tongwen Chen, Kent Z. Qi
■773 ▼tIEEE transactions on control systems technology▼gVol. 11 No. 1 (2003. 1)▼d2003, 01
■856 ▼uhttps://www.ieee.org/
■SIS ▼aS029530▼b60077650▼h8▼s1▼fP
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