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Defect Analysis via Photoluminescence of p-type ZnO:N Thin Film fabricated by RF Magnetron Sputtering
Defect Analysis via Photoluminescence of p-type ZnO:N Thin Film fabricated by RF Magnetron Sputtering
Detailed Information
- 자료유형
- 기사
- ISSN
- 12267945
- 저자명
- Hu Jie Jin
- 서명/저자
- Defect Analysis via Photoluminescence of p-type ZnO:N Thin Film fabricated by RF Magnetron Sputtering / Hu Jie Jin , Soon Jin So , Choon Bae Park 공저
- 발행사항
- 서울 : 한국전기전자재료학회, 2007.
- 형태사항
- pp. 202-206
- 주기사항
- 참고문헌 수록
- 원문정보
- url
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60233520
MARC
008191004s2007 ulk aa kor■022 ▼a12267945
■1001 ▼aHu Jie Jin
■24510▼aDefect Analysis via Photoluminescence of p-type ZnO:N Thin Film fabricated by RF Magnetron Sputtering▼dHu Jie Jin ▼eSoon Jin So , Choon Bae Park 공저
■260 ▼a서울▼b한국전기전자재료학회▼c2007.
■300 ▼app. 202-206
■500 ▼a참고문헌 수록
■7001 ▼aSoon Jin So , Choon Bae Park
■773 ▼t전기전자재료학회논문지(Journal of the korean Institute and Electronic▼g제20권 제3호 (2007년 3월)▼d2007, 03
■856 ▼uhttp://www.kieeme.or.kr
■SIS ▼aS037663▼b60055323▼h8▼s2▼fP
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