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Time-Resolved Photoluminescence Measurement of Frenkeltype Excitonic Lifetimes in InGaN/GaN Multi-quantum Well Structures
Time-Resolved Photoluminescence Measurement of Frenkeltype Excitonic Lifetimes in InGaN/GaN Multi-quantum Well Structures
Detailed Information
- Material Type
- 기사
- ISSN
- 12297607
- Author
- Gwi Su Shin
- Title/Author
- Time-Resolved Photoluminescence Measurement of Frenkeltype Excitonic Lifetimes in InGaN/GaN Multi-quantum Well Structures / Gwi Su Shin ; Sung Won Hwang , Keun Joo Kim
- Publish Info
- 서울 : 한국전기전자재료학회, 2004.
- Material Info
- pp. 19-23
- General Note
- Includes Bibliography
- Added Entry-Personal Name
- Sung Won Hwang , Keun Joo Kim
- Host Item Entry
- Transactions on Electrical and Electronic Materials : Vol.4, No.5 (2003 October) 2004, 10
- Electronic Location and Access
- url
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60232723
MARC
008190927s2004 ulk aa eng■022 ▼a12297607
■1001 ▼aGwi Su Shin
■24510▼aTime-Resolved Photoluminescence Measurement of Frenkeltype Excitonic Lifetimes in InGaN/GaN Multi-quantum Well Structures▼dGwi Su Shin ▼eSung Won Hwang , Keun Joo Kim
■260 ▼a서울▼b한국전기전자재료학회▼c2004.
■300 ▼app. 19-23
■500 ▼aIncludes Bibliography
■7001 ▼aSung Won Hwang , Keun Joo Kim
■773 ▼tTransactions on Electrical and Electronic Materials▼gVol.4, No.5 (2003 October)▼d2004, 10
■856 ▼uhttp://www.kieeme.or.kr
■SIS ▼aS014504▼b60055341▼h8▼s2▼fP
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