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Characterizations of Interface-state Density between To pSilicon and Buried Oxide on Nano-SOI Substrate by using Pseudo-MOSFETs
Characterizations of Interface-state Density between To pSilicon and Buried Oxide on Nano-SOI Substrate by using Pseudo-MOSFETs
Detailed Information
- 자료유형
- 기사
- ISSN
- 15981657
- 저자명
- Won-Ju cho
- 서명/저자
- Characterizations of Interface-state Density between To pSilicon and Buried Oxide on Nano-SOI Substrate by using Pseudo-MOSFETs / 저 Won-Ju cho
- 발행사항
- 서울 : 대한전자공학회, 2005.
- 형태사항
- pp. 83-88
- 주기사항
- 참고문헌 수록
- 원문정보
- url
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60202570
MARC
008190108s2005 ulk aa eng■022 ▼a15981657
■1001 ▼aWon-Ju cho
■24510▼aCharacterizations of Interface-state Density between To pSilicon and Buried Oxide on Nano-SOI Substrate by using Pseudo-MOSFETs▼d저 Won-Ju cho
■260 ▼a서울▼b대한전자공학회▼c2005.
■300 ▼app. 83-88
■500 ▼a참고문헌 수록
■773 ▼tJournal of Semiconductor Technology and Science▼gVolume 5, Number 2, (2005 June)▼d2005, 06
■856 ▼ahttp://www.jsts.org
■SIS ▼aS013706▼b60054120▼h8▼s2▼fP
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