서브메뉴
검색
Theoretical and Experimental Analysis of Back-Gated SOI MOSFETs and Back-Floating NVRAMs
Theoretical and Experimental Analysis of Back-Gated SOI MOSFETs and Back-Floating NVRAMs
Detailed Information
- Material Type
- 기사
- ISSN
- 15981657
- Author
- Uygar Avci
- Title/Author
- Theoretical and Experimental Analysis of Back-Gated SOI MOSFETs and Back-Floating NVRAMs / Uygar Avci ; 공저 Arvind Kumar, Sandip Tiwari
- Publish Info
- 서울 : 대한전자공학회, 2004.
- Material Info
- pp. 18-26
- General Note
- 참고문헌 수록
- Added Entry-Personal Name
- Arvind Kumar, Sandip Tiwari
- Host Item Entry
- Journal of Semiconductor Technology and Science : Volume 4, Number 1, (2004 March) 2004, 03
- Electronic Location and Access
- url
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60202487
MARC
008190108s2004 ulk aa eng■022 ▼a15981657
■1001 ▼aUygar Avci
■24510▼aTheoretical and Experimental Analysis of Back-Gated SOI MOSFETs and Back-Floating NVRAMs▼dUygar Avci▼e공저 Arvind Kumar, Sandip Tiwari
■260 ▼a서울▼b대한전자공학회▼c2004.
■300 ▼app. 18-26
■500 ▼a참고문헌 수록
■7001 ▼aArvind Kumar, Sandip Tiwari
■773 ▼tJournal of Semiconductor Technology and Science▼gVolume 4, Number 1, (2004 March)▼d2004, 03
■856 ▼ahttp://www.jsts.org
■SIS ▼aS013701▼b60054120▼h8▼s2▼fP
Preview
Export
ChatGPT Discussion
AI Recommended Related Books
Detail Info.
- Reservation
- Not Exist
- My Folder
- Reference Materials for Thesis Writing
- Reference Materials for Research Ethics
- Job-Related Books
