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Compact Gate Capacitance Model with Polysilicon Depletion Effect for MOS Device
Compact Gate Capacitance Model with Polysilicon Depletion Effect for MOS Device / H. Abebe...
Compact Gate Capacitance Model with Polysilicon Depletion Effect for MOS Device

Detailed Information

자료유형  
 기사
ISSN  
15981657
저자명  
H. Abebe
서명/저자  
Compact Gate Capacitance Model with Polysilicon Depletion Effect for MOS Device / H. Abebe , 공저 H. Morris, E. Cumberbatch, V. Tyree
발행사항  
서울 : 대한전자공학회, 2007.
형태사항  
pp. 209-213
주기사항  
참고문헌 수록
기타저자  
H. Morris, E. Cumberbatch, V. Tyree
기본자료저록  
Journal of Semiconductor Technology and Science : Volume 7, Number 3, (2007 September) 2007, 09
원문정보  
 url
모체레코드  
모체정보확인
Control Number  
kjul:60202475

MARC

 008190107s2007        ulk                          aa    eng
■022    ▼a15981657
■1001  ▼aH.  Abebe
■24510▼aCompact  Gate  Capacitance  Model  with  Polysilicon  Depletion  Effect  for  MOS  Device▼dH.  Abebe▼e공저  H.  Morris,  E.  Cumberbatch,  V.  Tyree
■260    ▼a서울▼b대한전자공학회▼c2007.
■300    ▼app.  209-213
■500    ▼a참고문헌  수록
■7001  ▼aH.  Morris,  E.  Cumberbatch,  V.  Tyree
■773    ▼tJournal  of  Semiconductor  Technology  and  Science▼gVolume  7,  Number  3,  (2007  September)▼d2007,  09
■856    ▼ahttp://www.jsts.org
■SIS    ▼aS043240▼b60054120▼h8▼s2▼fP

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