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Analysis on the Defects in the Molecular Structures of MgO Films Deposited with Different Evaporation Rates in Ac Plasma Display Panels
Analysis on the Defects in the Molecular Structures of MgO Films Deposited with Different Evaporation Rates in Ac Plasma Display Panels
Detailed Information
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- Yong jae Kim
- 서명/저자
- Analysis on the Defects in the Molecular Structures of MgO Films Deposited with Different Evaporation Rates in Ac Plasma Display Panels / Yong jae Kim , Eou sik cho , Sang Jik Kwon
- 발행사항
- 서울 : 한국물리학회, 2007.
- 형태사항
- pp. 1265-1270
- 기타저자
- Eou sik cho
- 기타저자
- Sang Jik Kwon
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60147777
MARC
008101209s2007 ulka a eng■022 ▼a03744884
■1001 ▼aYong jae Kim
■24510▼aAnalysis on the Defects in the Molecular Structures of MgO Films Deposited with Different Evaporation Rates in Ac Plasma Display Panels▼dYong jae Kim▼eEou sik cho▼eSang Jik Kwon
■260 ▼a서울▼b한국물리학회▼c2007.
■300 ▼app. 1265-1270
■7001 ▼aEou sik cho
■7001 ▼aSang Jik Kwon
■773 ▼tJournal of The Korean Physical Society▼gVol. 50 No. 5 (2007. 5)▼d2007, 05
■SIS ▼aS040249▼b60077342▼h8▼s2▼fP
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