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A Study of Structures in ZnO and ZnO:V₂O5 Thin Films by In-Situ Synchrotron X-ray Scattering
A Study of Structures in ZnO and ZnO:V₂O5 Thin Films by In-Situ Synchrotron X-ray Scattering
상세정보
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- S. W. Hwang
- 서명/저자
- A Study of Structures in ZnO and ZnO:V₂O5 Thin Films by In-Situ Synchrotron X-ray Scattering / S. W. Hwang , H. K. Kim , Yoon-Hwae Hwang , Kwang-Nak Koh
- 발행사항
- 서울 : 한국물리학회, 2007.
- 형태사항
- pp. 862-865
- 기타저자
- H. K. Kim
- 기타저자
- Yoon-Hwae Hwang
- 기타저자
- Kwang-Nak Koh
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60147001
MARC
008101125s2007 ulka a eng■022 ▼a03744884
■1001 ▼aS. W. Hwang
■24510▼aA Study of Structures in ZnO and ZnO:V₂O5 Thin Films by In-Situ Synchrotron X-ray Scattering▼dS. W. Hwang▼eH. K. Kim▼eYoon-Hwae Hwang▼eKwang-Nak Koh
■260 ▼a서울▼b한국물리학회▼c2007.
■300 ▼app. 862-865
■7001 ▼aH. K. Kim
■7001 ▼aYoon-Hwae Hwang
■7001 ▼aKwang-Nak Koh
■773 ▼tJournal of The Korean Physical Society▼gVol. 51 No. 2 Pt.1(2007. 8)▼d2007, 08
■SIS ▼aS041153▼b60077342▼h8▼s2▼fP
