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Thickness Dependence of Domain Switching of Ferroelectric PbZr0.35Ti0.65O₃ Thin Film by Scanning Probe Microscopy
Thickness Dependence of Domain Switching of Ferroelectric PbZr0.35Ti0.65O₃ Thin Film by Scanning Probe Microscopy
Detailed Information
- Material Type
- 기사
- ISSN
- 03744884
- Author
- C. H. Kim
- Title/Author
- Thickness Dependence of Domain Switching of Ferroelectric PbZr0.35Ti0.65O₃ Thin Film by Scanning Probe Microscopy / C. H. Kim ; K. S. Song ; H. B. Moon ; J. Y. Son ; Bog G. Kim ; J. H. Cho
- Publish Info
- 서울 : 한국물리학회, 2007.
- Material Info
- pp. 687-691
- Added Entry-Personal Name
- K. S. Song
- Added Entry-Personal Name
- H. B. Moon
- Added Entry-Personal Name
- J. Y. Son
- Added Entry-Personal Name
- Bog G. Kim
- Added Entry-Personal Name
- J. H. Cho
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60146853
MARC
008101123s2007 ulka a eng■022 ▼a03744884
■1001 ▼aC. H. Kim
■24510▼aThickness Dependence of Domain Switching of Ferroelectric PbZr0.35Ti0.65O₃ Thin Film by Scanning Probe Microscopy▼dC. H. Kim▼eK. S. Song▼eH. B. Moon▼eJ. Y. Son▼eBog G. Kim▼eJ. H. Cho
■260 ▼a서울▼b한국물리학회▼c2007.
■300 ▼app. 687-691
■7001 ▼aK. S. Song
■7001 ▼aH. B. Moon
■7001 ▼aJ. Y. Son
■7001 ▼aBog G. Kim
■7001 ▼aJ. H. Cho
■773 ▼tJournal of The Korean Physical Society▼gVol. 51 No. 2 Pt.1(2007. 8)▼d2007, 08
■SIS ▼aS041153▼b60077342▼h8▼s2▼fP
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