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Optical Properties of Europium-Silicate Thin Films Fabricated on Different SiOχ Intermediate Layer
Optical Properties of Europium-Silicate Thin Films Fabricated on Different SiOχ Intermediate Layer
Detailed Information
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- Young Chul Shin
- 서명/저자
- Optical Properties of Europium-Silicate Thin Films Fabricated on Different SiOχ Intermediate Layer / Young Chul Shin , Eun Hong Kim , Shi Jong leem , Tae Geun Kim , Cheol Koo Hahn
- 발행사항
- 서울 : 한국물리학회, 2007.
- 형태사항
- pp. 1764-1768
- 기타저자
- Eun Hong Kim
- 기타저자
- Shi Jong leem
- 기타저자
- Tae Geun Kim
- 기타저자
- Cheol Koo Hahn
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60145964
MARC
008101027s2007 ulka a eng■022 ▼a03744884
■1001 ▼aYoung Chul Shin
■24510▼aOptical Properties of Europium-Silicate Thin Films Fabricated on Different SiOχ Intermediate Layer▼dYoung Chul Shin▼eEun Hong Kim▼eShi Jong leem▼eTae Geun Kim▼eCheol Koo Hahn
■260 ▼a서울▼b한국물리학회▼c2007.
■300 ▼app. 1764-1768
■7001 ▼aEun Hong Kim
■7001 ▼aShi Jong leem
■7001 ▼aTae Geun Kim
■7001 ▼aCheol Koo Hahn
■773 ▼tJournal of The Korean Physical Society▼gVol. 50 No. 6 (2007. 6)▼d2007, 06
■SIS ▼aS040681▼b60077342▼h8▼s2▼fP
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