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Photoluminescence Characterization of Dependence of Si-Nanocrystals Formation in Si-Rich Sioχ on Thickness. Oxygen Content, and the Existence of a SiO₂ Cap Layer
Photoluminescence Characterization of Dependence of Si-Nanocrystals Formation in Si-Rich Sioχ on Thickness. Oxygen Content, and the Existence of a SiO₂ Cap Layer
Detailed Information
- Material Type
- 기사
- ISSN
- 03744884
- Author
- Min Choul Kim
- Title/Author
- Photoluminescence Characterization of Dependence of Si-Nanocrystals Formation in Si-Rich Sioχ on Thickness. Oxygen Content, and the Existence of a SiO₂ Cap Layer / Min Choul Kim ; Yong Min Park ; Suk-Ho choi ; Kyung Joong Kim
- Publish Info
- 서울 : 한국물리학회, 2007.
- Material Info
- pp. 1760-1763
- Added Entry-Personal Name
- Yong Min Park
- Added Entry-Personal Name
- Suk-Ho choi
- Added Entry-Personal Name
- Kyung Joong Kim
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60145959
MARC
008101027s2007 ulka a eng■022 ▼a03744884
■1001 ▼aMin Choul Kim
■24510▼aPhotoluminescence Characterization of Dependence of Si-Nanocrystals Formation in Si-Rich Sioχ on Thickness. Oxygen Content, and the Existence of a SiO₂ Cap Layer▼dMin Choul Kim▼eYong Min Park▼eSuk-Ho choi▼eKyung Joong Kim
■260 ▼a서울▼b한국물리학회▼c2007.
■300 ▼app. 1760-1763
■7001 ▼aYong Min Park
■7001 ▼aSuk-Ho choi
■7001 ▼aKyung Joong Kim
■773 ▼tJournal of The Korean Physical Society▼gVol. 50 No. 6 (2007. 6)▼d2007, 06
■SIS ▼aS040681▼b60077342▼h8▼s2▼fP
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