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Electrical Properties of BiFeO₃-Doped PZT Thin Films for Embedded FeRAM Devices
Electrical Properties of BiFeO₃-Doped PZT Thin Films for Embedded FeRAM Devices
Detailed Information
- Material Type
- 기사
- ISSN
- 03744884
- Author
- Chang Young Koo
- Title/Author
- Electrical Properties of BiFeO₃-Doped PZT Thin Films for Embedded FeRAM Devices / Chang Young Koo ; Jong-Hyeon Cheon ; Jung-Hoon Yeom ; Jowoong Ha ; Seung-Hyun Kim ; Suk-Kyoung Hong
- Publish Info
- 서울 : 한국물리학회, 2007.
- Material Info
- pp. 514-517
- Added Entry-Personal Name
- Jong-Hyeon Cheon
- Added Entry-Personal Name
- Jung-Hoon Yeom
- Added Entry-Personal Name
- Jowoong Ha
- Added Entry-Personal Name
- Seung-Hyun Kim
- Added Entry-Personal Name
- Suk-Kyoung Hong
- Host Item Entry
- Journal of The Korean Physical Society : Vol. 49 supplementary isssu II.(2006.12) 2007, 01
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60145543
MARC
008101019s2007 ulka a eng■022 ▼a03744884
■1001 ▼aChang Young Koo
■24510▼aElectrical Properties of BiFeO₃-Doped PZT Thin Films for Embedded FeRAM Devices▼dChang Young Koo▼eJong-Hyeon Cheon▼eJung-Hoon Yeom▼eJowoong Ha▼eSeung-Hyun Kim▼eSuk-Kyoung Hong
■260 ▼a서울▼b한국물리학회▼c2007.
■300 ▼app. 514-517
■7001 ▼aJong-Hyeon Cheon
■7001 ▼aJung-Hoon Yeom
■7001 ▼aJowoong Ha
■7001 ▼aSeung-Hyun Kim
■7001 ▼aSuk-Kyoung Hong
■773 ▼tJournal of The Korean Physical Society▼gVol. 49 supplementary isssu II.(2006.12)▼d2007, 01
■SIS ▼aS036913▼b60077342▼h8▼s2▼fP
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