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Conducting Atomic Force Microscopy by Half-Metallic Ferromagnetic CrO₂-Coated Cantilever
Conducting Atomic Force Microscopy by Half-Metallic Ferromagnetic CrO₂-Coated Cantilever
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MARC
008101015s2007 ulka a eng■022 ▼a03744884
■1001 ▼aJ. Y. Son
■24510▼aConducting Atomic Force Microscopy by Half-Metallic Ferromagnetic CrO₂-Coated Cantilever▼dJ. Y. Son▼eJ. H. Cho
■260 ▼a서울▼b한국물리학회▼c2007.
■300 ▼app. 456-459
■7001 ▼aJ. H. Cho
■773 ▼tJournal of The Korean Physical Society▼gVol. 49 supplementary isssu II.(2006.12)▼d2007, 01
■SIS ▼aS036913▼b60077342▼h8▼s2▼fP


