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Characterization of Sputter-Deposited SrZrO₃ : Cr Films on Si Substrates for Commercial Memory Device Applications
Characterization of Sputter-Deposited SrZrO₃ : Cr Films on Si Substrates for Commercial Memory Device Applications
Detailed Information
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- Jae-Wan Park
- 서명/저자
- Characterization of Sputter-Deposited SrZrO₃ : Cr Films on Si Substrates for Commercial Memory Device Applications / Jae-Wan Park , Jong-Wan Park , Jeon-Kook Lee
- 발행사항
- 서울 : 한국물리학회, 2007.
- 형태사항
- pp. 447-451
- 기타저자
- Jong-Wan Park
- 기타저자
- Jeon-Kook Lee
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60145386
MARC
008101015s2007 ulka a eng■022 ▼a03744884
■1001 ▼aJae-Wan Park
■24510▼aCharacterization of Sputter-Deposited SrZrO₃▼bCr Films on Si Substrates for Commercial Memory Device Applications▼dJae-Wan Park▼eJong-Wan Park▼eJeon-Kook Lee
■260 ▼a서울▼b한국물리학회▼c2007.
■300 ▼app. 447-451
■7001 ▼aJong-Wan Park
■7001 ▼aJeon-Kook Lee
■773 ▼tJournal of The Korean Physical Society▼gVol. 49 supplementary isssu II.(2006.12)▼d2007, 01
■SIS ▼aS036913▼b60077342▼h8▼s2▼fP
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