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Hot Carrier Effect in Low-Temperature Poly-Si TFTs with Sputtered Gate SiO₂ Films
Hot Carrier Effect in Low-Temperature Poly-Si TFTs with Sputtered Gate SiO₂ Films
Detailed Information
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- YuKiharu Uraoka
- 서명/저자
- Hot Carrier Effect in Low-Temperature Poly-Si TFTs with Sputtered Gate SiO₂ Films / YuKiharu Uraoka , Makoto Miyashita , Yuta Sugawara , Hiroshi Yano , Tomoaki Hatayama , Takashi fuyuki , Tadashi Serikawa
- 발행사항
- 서울 : 한국물리학회, 2006.
- 형태사항
- pp. 1477-1481
- 기타저자
- Makoto Miyashita
- 기타저자
- Yuta Sugawara
- 기타저자
- Hiroshi Yano
- 기타저자
- Tomoaki Hatayama
- 기타저자
- Takashi fuyuki
- 기타저자
- Tadashi Serikawa
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60144812
MARC
008101012s2006 ulka a eng■022 ▼a03744884
■1001 ▼aYuKiharu Uraoka
■24510▼aHot Carrier Effect in Low-Temperature Poly-Si TFTs with Sputtered Gate SiO₂ Films▼dYuKiharu Uraoka▼eMakoto Miyashita▼eYuta Sugawara▼eHiroshi Yano▼eTomoaki Hatayama▼eTakashi fuyuki▼eTadashi Serikawa
■260 ▼a서울▼b한국물리학회▼c2006.
■300 ▼app. 1477-1481
■7001 ▼aMakoto Miyashita
■7001 ▼aYuta Sugawara
■7001 ▼aHiroshi Yano
■7001 ▼aTomoaki Hatayama
■7001 ▼aTakashi fuyuki
■7001 ▼aTadashi Serikawa
■773 ▼tJournal of The Korean Physical Society▼gVol. 49 No. 4 (2006. 10)▼d2006, 10
■SIS ▼aS035357▼b60077342▼h8▼s2▼fP
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