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Ellipsometric Study of the Optical Properties of Silicon-Baded Si:SiO₂ composite Thin films under Different annealing Temperatures
Ellipsometric Study of the Optical Properties of Silicon-Baded Si:SiO₂ composite Thin films under Different annealing Temperatures
Detailed Information
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- Bin Sun
- 서명/저자
- Ellipsometric Study of the Optical Properties of Silicon-Baded Si:SiO₂ composite Thin films under Different annealing Temperatures / Bin Sun , Yue-Rui Chen , Peng Zhou , Cong-Hui Xu , Yu-Fei Kong , Yu-Xiang Zheng , Liang-Yao Chen
- 발행사항
- 서울 : 한국물리학회, 2006.
- 형태사항
- pp. 2184-2187
- 기타저자
- Yue-Rui Chen
- 기타저자
- Peng Zhou
- 기타저자
- Cong-Hui Xu
- 기타저자
- Yu-Fei Kong
- 기타저자
- Yu-Xiang Zheng
- 기타저자
- Liang-Yao Chen
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60144687
MARC
008101011s2006 ulka a eng■022 ▼a03744884
■1001 ▼aBin Sun
■24510▼aEllipsometric Study of the Optical Properties of Silicon-Baded Si:SiO₂ composite Thin films under Different annealing Temperatures▼dBin Sun▼eYue-Rui Chen▼ePeng Zhou▼eCong-Hui Xu▼eYu-Fei Kong▼eYu-Xiang Zheng▼eLiang-Yao Chen
■260 ▼a서울▼b한국물리학회▼c2006.
■300 ▼app. 2184-2187
■7001 ▼aYue-Rui Chen
■7001 ▼aPeng Zhou
■7001 ▼aCong-Hui Xu
■7001 ▼aYu-Fei Kong
■7001 ▼aYu-Xiang Zheng
■7001 ▼aLiang-Yao Chen
■773 ▼tJournal of The Korean Physical Society▼gVol. 49 No. 5 (2006. 11)Pt. 1▼d2006, 11
■SIS ▼aS036673▼b60077342▼h8▼s2▼fP
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