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Electrical Characterization of Si Nanoparticles Embedded in SiO₂Thin Films
Electrical Characterization of Si Nanoparticles Embedded in SiO₂Thin Films
Detailed Information
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- Yang Do Kim
- 서명/저자
- Electrical Characterization of Si Nanoparticles Embedded in SiO₂Thin Films / Yang Do Kim , Eun Kyu Kim , Soojin Lee , Woon Jo Cho
- 발행사항
- 서울 : 한국물리학회, 2006.
- 형태사항
- pp. 1192-1195
- 기타저자
- Eun Kyu Kim
- 기타저자
- Soojin Lee
- 기타저자
- Woon Jo Cho
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60144214
MARC
008101007s2006 ulka a eng■022 ▼a03744884
■1001 ▼aYang Do Kim
■24510▼aElectrical Characterization of Si Nanoparticles Embedded in SiO₂Thin Films▼dYang Do Kim▼eEun Kyu Kim▼eSoojin Lee▼eWoon Jo Cho
■260 ▼a서울▼b한국물리학회▼c2006.
■300 ▼app. 1192-1195
■7001 ▼aEun Kyu Kim
■7001 ▼aSoojin Lee
■7001 ▼aWoon Jo Cho
■773 ▼tJournal of The Korean Physical Society▼gVol. 49 No. 3 (2006. 9)▼d2006, 09
■SIS ▼aS034322▼b60077342▼h8▼s2▼fP
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