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In-Situ Monitoring of InAs/GaAs QDs by Using Spectral Reflectance
In-Situ Monitoring of InAs/GaAs QDs by Using Spectral Reflectance / E. Ahn , Y. S. Lee , J...
In-Situ Monitoring of InAs/GaAs QDs by Using Spectral Reflectance

Detailed Information

자료유형  
 기사
ISSN  
03744884
저자명  
E. Ahn
서명/저자  
In-Situ Monitoring of InAs/GaAs QDs by Using Spectral Reflectance / E. Ahn , Y. S. Lee , J. Kim , E. Yoon , Y. D. Kim
발행사항  
서울 : 한국물리학회, 2006.
형태사항  
pp. 947-950
기타저자  
Y. S. Lee
기타저자  
J. Kim
기타저자  
E. Yoon
기타저자  
Y. D. Kim
기본자료저록  
Journal of The Korean Physical Society : Vol. 49 No. 3 (2006. 9) 2006, 09
모체레코드  
모체정보확인
Control Number  
kjul:60144084

MARC

 008101004s2006        ulka    a                          eng
■022    ▼a03744884
■1001  ▼aE.  Ahn
■24510▼aIn-Situ  Monitoring  of  InAs/GaAs  QDs  by  Using  Spectral  Reflectance▼dE.  Ahn▼eY.  S.  Lee▼eJ.  Kim▼eE.  Yoon▼eY.  D.  Kim
■260    ▼a서울▼b한국물리학회▼c2006.
■300    ▼app.  947-950
■7001  ▼aY.  S.  Lee
■7001  ▼aJ.  Kim
■7001  ▼aE.  Yoon
■7001  ▼aY.  D.  Kim
■773    ▼tJournal  of  The  Korean  Physical  Society▼gVol.  49  No.  3  (2006.  9)▼d2006,  09
■SIS    ▼aS034322▼b60077342▼h8▼s2▼fP

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