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Study of the Degradation of the Breakdown Voltage of a Super-Junction Power MOSFET due to Charge Imbalance
Study of the Degradation of the Breakdown Voltage of a Super-Junction Power MOSFET due to Charge Imbalance
Detailed Information
- 자료유형
- 기사
- ISSN
- 03744884
- 서명/저자
- Study of the Degradation of the Breakdown Voltage of a Super-Junction Power MOSFET due to Charge Imbalance / Pravin N. Kondekar , Hwan-Sool Oh , Young Beom Kim
- 발행사항
- 서울 : 한국물리학회, 2006.
- 형태사항
- pp. 624-630
- 기타저자
- Hwan-Sool Oh
- 기타저자
- Young Beom Kim
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60144013
MARC
008100928s2006 ulka a eng■022 ▼a03744884
■1001 ▼aPravin N. Kondekar
■24510▼aStudy of the Degradation of the Breakdown Voltage of a Super-Junction Power MOSFET due to Charge Imbalance▼dPravin N. Kondekar▼eHwan-Sool Oh▼eYoung Beom Kim
■260 ▼a서울▼b한국물리학회▼c2006.
■300 ▼app. 624-630
■7001 ▼aHwan-Sool Oh
■7001 ▼aYoung Beom Kim
■773 ▼tJournal of The Korean Physical Society▼gVol. 48 No. 4 (2006. 4)▼d2006, 04
■SIS ▼aS028401▼b60077342▼h8▼s2▼fP
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