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Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method
Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method
Detailed Information
- Material Type
- 기사
- ISSN
- 03744884
- Author
- Hui-Youn Shin
- Title/Author
- Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method / Hui-Youn Shin ; Y. I. Chang ; Y. W. Jung ; M. J. Cho ; K. H. Park
- Publish Info
- 서울 : 한국물리학회, 2006.
- Material Info
- pp. 302-306
- Added Entry-Personal Name
- Y. I. Chang
- Added Entry-Personal Name
- Y. W. Jung
- Added Entry-Personal Name
- M. J. Cho
- Added Entry-Personal Name
- K. H. Park
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60143907
MARC
008100927s2006 ulka a eng■022 ▼a03744884
■1001 ▼aHui-Youn Shin
■24510▼aEvaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method▼dHui-Youn Shin▼eY. I. Chang▼eY. W. Jung▼eM. J. Cho▼eK. H. Park
■260 ▼a서울▼b한국물리학회▼c2006.
■300 ▼app. 302-306
■7001 ▼aY. I. Chang
■7001 ▼aY. W. Jung
■7001 ▼aM. J. Cho
■7001 ▼aK. H. Park
■773 ▼tJournal of The Korean Physical Society▼gVol. 48 No. 2 (2006. 2)▼d2006, 02
■SIS ▼aS028399▼b60077342▼h8▼s2▼fP
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