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Development of a TWwo-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Development of a TWwo-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Detailed Information
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- Jinwon Park
- 서명/저자
- Development of a TWwo-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer / Jinwon Park , Jaegun Jo , Sangho Byun , Jae Wan Kim , Tae Bong Eom , Cheon Il Eom
- 발행사항
- 서울 : 한국물리학회, 2006.
- 형태사항
- pp. 28-32
- 기타저자
- Jaegun Jo
- 기타저자
- Sangho Byun
- 기타저자
- Jae Wan Kim
- 기타저자
- Tae Bong Eom
- 기타저자
- Cheon Il Eom
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60143430
MARC
008100914s2006 ulka a eng■022 ▼a03744884
■1001 ▼aJinwon Park
■24510▼aDevelopment of a TWwo-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer▼dJinwon Park▼eJaegun Jo▼eSangho Byun▼eJae Wan Kim▼eTae Bong Eom▼eCheon Il Eom
■260 ▼a서울▼b한국물리학회▼c2006.
■300 ▼app. 28-32
■7001 ▼aJaegun Jo
■7001 ▼aSangho Byun
■7001 ▼aJae Wan Kim
■7001 ▼aTae Bong Eom
■7001 ▼aCheon Il Eom
■773 ▼tJournal of The Korean Physical Society▼gVol. 48 No. 1 (2006. 1)▼d2006, 01
■SIS ▼aS028398▼b60077342▼h8▼s2▼fP
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