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Effect of mechanical backside damage upon minority carrier recombination lifetime measurement by laser/microwave photoconductance technique
Effect of mechanical backside damage upon minority carrier recombination lifetime measurement by laser/microwave photoconductance technique
Detailed Information
- Material Type
- 기사
- ISSN
- 12251429
- Author
- Chi Young Choi
- Title/Author
- Effect of mechanical backside damage upon minority carrier recombination lifetime measurement by laser/microwave photoconductance technique / Chi Young Choi ; Ki Hyun Cho ; Sang Hee Cho
- Publish Info
- 서울 : 한국결정성장학회, 1995.
- Material Info
- pp. 408-413
- Added Entry-Personal Name
- Ki Hyun Cho
- Added Entry-Personal Name
- Sang Hee Cho
- Host Item Entry
- Journal of the Korean Crystal Growth and Crystal Technology : Vol. 5 No. 4 (1995년 12월) 1995, 12
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60142654
MARC
008100830s1995 ulka a kor■022 ▼a12251429
■1001 ▼aChi Young Choi
■24510▼aEffect of mechanical backside damage upon minority carrier recombination lifetime measurement by laser/microwave photoconductance technique▼dChi Young Choi▼eKi Hyun Cho▼eSang Hee Cho
■260 ▼a서울▼b한국결정성장학회▼c1995.
■300 ▼app. 408-413
■7001 ▼aKi Hyun Cho
■7001 ▼aSang Hee Cho
■773 ▼tJournal of the Korean Crystal Growth and Crystal Technology▼gVol. 5 No. 4 (1995년 12월)▼d1995, 12
■SIS ▼aS034023▼b60077034▼h8▼s2▼fP
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