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Defect Analysis in Gd2O2S:Tb by Using X-ray Radiation with Positron Annihilation Methods
Defect Analysis in Gd2O2S:Tb by Using X-ray Radiation with Positron Annihilation Methods ...
Defect Analysis in Gd2O2S:Tb by Using X-ray Radiation with Positron Annihilation Methods

Detailed Information

자료유형  
 기사
ISSN  
03744884
저자명  
C.Y.Lee
서명/저자  
Defect Analysis in Gd2O2S:Tb by Using X-ray Radiation with Positron Annihilation Methods / C.Y.Lee , J.H.Kwon , H.H.Kim , J.M.Jeong
발행사항  
서울 : 한국물리학회, 2007.
형태사항  
pp. 1172-1175
기타저자  
J.H.Kwon
기타저자  
H.H.Kim
기타저자  
J.M.Jeong
기본자료저록  
Journal of The Korean Physical Society : Vol. 51 No. 3 (2007. 9) 2007, 09
모체레코드  
모체정보확인
Control Number  
kjul:60141816

MARC

 008100820s2007        ulka    a                          eng
■022    ▼a03744884
■1001  ▼aC.Y.Lee
■24510▼aDefect  Analysis  in  Gd2O2S:Tb  by  Using  X-ray  Radiation  with  Positron  Annihilation  Methods  ▼dC.Y.Lee▼eJ.H.Kwon▼eH.H.Kim▼eJ.M.Jeong
■260    ▼a서울▼b한국물리학회▼c2007.
■300    ▼app.  1172-1175
■7001  ▼aJ.H.Kwon
■7001  ▼aH.H.Kim
■7001  ▼aJ.M.Jeong
■773    ▼tJournal  of  The  Korean  Physical  Society▼gVol.  51  No.  3  (2007.  9)▼d2007,  09
■SIS    ▼aS043255▼b60077342▼h8▼s2▼fP

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