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Analysis of Surfaces and Thin Films by Using Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
Analysis of Surfaces and Thin Films by Using Auger Electron Spectroscopy and X-ray Photoel...
Analysis of Surfaces and Thin Films by Using Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Detailed Information

자료유형  
 기사
ISSN  
03744884
저자명  
John T. Grant
서명/저자  
Analysis of Surfaces and Thin Films by Using Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy / John T. Grant
발행사항  
서울 : 한국물리학회, 2007.
형태사항  
pp. 925-932
기본자료저록  
Journal of The Korean Physical Society : Vol. 51 No. 3 (2007. 9) 2007, 09
모체레코드  
모체정보확인
Control Number  
kjul:60141565

MARC

 008100819s2007        ulka    a                          eng
■022    ▼a03744884
■1001  ▼aJohn  T.  Grant
■24510▼aAnalysis  of  Surfaces  and  Thin  Films  by  Using  Auger  Electron  Spectroscopy  and  X-ray  Photoelectron  Spectroscopy▼dJohn  T.  Grant
■260    ▼a서울▼b한국물리학회▼c2007.
■300    ▼app.  925-932
■773    ▼tJournal  of  The  Korean  Physical  Society▼gVol.  51  No.  3  (2007.  9)▼d2007,  09
■SIS    ▼aS043255▼b60077342▼h8▼s2▼fP

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