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Bitmap-Assisted Focused Ion Beam Fabrication of Combined Atomic Force Scanning Electrochemical Microscopy Probes
Bitmap-Assisted Focused Ion Beam Fabrication of Combined Atomic Force Scanning Electrochemical Microscopy Probes
Detailed Information
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- Jong-Seok Moon
- 서명/저자
- Bitmap-Assisted Focused Ion Beam Fabrication of Combined Atomic Force Scanning Electrochemical Microscopy Probes / Jong-Seok Moon , Heungjoo Shin , Boris Mizaikoff , Christine Kranz
- 발행사항
- 서울 : 한국물리학회, 2007.
- 형태사항
- pp. 920-924
- 기타저자
- Heungjoo Shin
- 기타저자
- Boris Mizaikoff
- 기타저자
- Christine Kranz
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60141564
MARC
008100819s2007 ulka a eng■022 ▼a03744884
■1001 ▼aJong-Seok Moon
■24510▼aBitmap-Assisted Focused Ion Beam Fabrication of Combined Atomic Force Scanning Electrochemical Microscopy Probes▼dJong-Seok Moon▼eHeungjoo Shin▼eBoris Mizaikoff▼eChristine Kranz
■260 ▼a서울▼b한국물리학회▼c2007.
■300 ▼app. 920-924
■7001 ▼aHeungjoo Shin
■7001 ▼aBoris Mizaikoff
■7001 ▼aChristine Kranz
■773 ▼tJournal of The Korean Physical Society▼gVol. 51 No. 3 (2007. 9)▼d2007, 09
■SIS ▼aS043255▼b60077342▼h8▼s2▼fP
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