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Bitmap-Assisted Focused Ion Beam Fabrication of Combined Atomic Force Scanning Electrochemical Microscopy Probes
Bitmap-Assisted Focused Ion Beam Fabrication of Combined Atomic Force Scanning Electrochemical Microscopy Probes
Detailed Information
- Material Type
- 기사
- ISSN
- 03744884
- Author
- Jong-Seok Moon
- Title/Author
- Bitmap-Assisted Focused Ion Beam Fabrication of Combined Atomic Force Scanning Electrochemical Microscopy Probes / Jong-Seok Moon ; Heungjoo Shin ; Boris Mizaikoff ; Christine Kranz
- Publish Info
- 서울 : 한국물리학회, 2007.
- Material Info
- pp. 920-924
- Added Entry-Personal Name
- Heungjoo Shin
- Added Entry-Personal Name
- Boris Mizaikoff
- Added Entry-Personal Name
- Christine Kranz
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60141564
MARC
008100819s2007 ulka a eng■022 ▼a03744884
■1001 ▼aJong-Seok Moon
■24510▼aBitmap-Assisted Focused Ion Beam Fabrication of Combined Atomic Force Scanning Electrochemical Microscopy Probes▼dJong-Seok Moon▼eHeungjoo Shin▼eBoris Mizaikoff▼eChristine Kranz
■260 ▼a서울▼b한국물리학회▼c2007.
■300 ▼app. 920-924
■7001 ▼aHeungjoo Shin
■7001 ▼aBoris Mizaikoff
■7001 ▼aChristine Kranz
■773 ▼tJournal of The Korean Physical Society▼gVol. 51 No. 3 (2007. 9)▼d2007, 09
■SIS ▼aS043255▼b60077342▼h8▼s2▼fP
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