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Roughness Analysis of GaN Surfaces at Different Annealing Temperatures for an AIN Buffer Layer
Roughness Analysis of GaN Surfaces at Different Annealing Temperatures for an AIN Buffer Layer
Detailed Information
- Material Type
- 기사
- ISSN
- 03744884
- Author
- M. K. Bae
- Title/Author
- Roughness Analysis of GaN Surfaces at Different Annealing Temperatures for an AIN Buffer Layer / M. K. Bae ; D. H. Shin ; S. N. Yi ; S. H. Doh ; J. H. Na ; K. H. Lee ; R. A. Taylor ; S. H. Park
- Publish Info
- 서울 : 한국물리학회, 2007.
- Material Info
- pp. 209-213
- Added Entry-Personal Name
- D. H. Shin
- Added Entry-Personal Name
- S. N. Yi
- Added Entry-Personal Name
- S. H. Doh
- Added Entry-Personal Name
- J. H. Na
- Added Entry-Personal Name
- K. H. Lee
- Added Entry-Personal Name
- R. A. Taylor
- Added Entry-Personal Name
- S. H. Park
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60141288
MARC
008100816s2007 ulka a eng■022 ▼a03744884
■1001 ▼aM. K. Bae
■24510▼aRoughness Analysis of GaN Surfaces at Different Annealing Temperatures for an AIN Buffer Layer▼dM. K. Bae▼eD. H. Shin▼eS. N. Yi▼eS. H. Doh▼eJ. H. Na▼eK. H. Lee▼eR. A. Taylor▼eS. H. Park
■260 ▼a서울▼b한국물리학회▼c2007.
■300 ▼app. 209-213
■7001 ▼aD. H. Shin
■7001 ▼aS. N. Yi
■7001 ▼aS. H. Doh
■7001 ▼aJ. H. Na
■7001 ▼aK. H. Lee
■7001 ▼aR. A. Taylor
■7001 ▼aS. H. Park
■773 ▼tJournal of The Korean Physical Society▼gVol. 51 No. 1 Pt.1 (2007. 7)▼d2007, 07
■SIS ▼aS041108▼b60077342▼h8▼s2▼fP
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