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Structural Characteristics of SiGe/Si Materials Investigated by Raman Spectroscopy
Structural Characteristics of SiGe/Si Materials Investigated by Raman Spectroscopy
Detailed Information
- Material Type
- 기사
- ISSN
- 15989623
- Author
- ChangChun Chen
- Title/Author
- Structural Characteristics of SiGe/Si Materials Investigated by Raman Spectroscopy / ChangChun Chen ; BenHai Yu ; Jiangfeng Liu ; QiRun Dai
- Publish Info
- 서울 : 대한금속재료학회, 2005.
- Material Info
- pp. 279-284
- Added Entry-Personal Name
- BenHai Yu
- Added Entry-Personal Name
- Jiangfeng Liu
- Added Entry-Personal Name
- QiRun Dai
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60132437
MARC
008100610s2005 ulka a eng■022 ▼a15989623
■1001 ▼aChangChun Chen
■24510▼aStructural Characteristics of SiGe/Si Materials Investigated by Raman Spectroscopy▼dChangChun Chen▼eBenHai Yu▼eJiangfeng Liu▼eQiRun Dai
■260 ▼a서울▼b대한금속재료학회▼c2005.
■300 ▼app. 279-284
■7001 ▼aBenHai Yu
■7001 ▼aJiangfeng Liu
■7001 ▼aQiRun Dai
■773 ▼tMetals and Materials international▼gVOL.11 NO.4 (2005 AUGUST)▼d2005, 08
■SIS ▼aS025139▼b60013551▼h8▼s2▼fP
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