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Direct Evidence of Hole Injection Enhanced by O₂Plasma Treatment on Indium Tin Oxide
Direct Evidence of Hole Injection Enhanced by O₂Plasma Treatment on Indium Tin Oxide / So...
Direct Evidence of Hole Injection Enhanced by O₂Plasma Treatment on Indium Tin Oxide

Detailed Information

자료유형  
 기사
ISSN  
17388090
저자명  
Soo Young Kim and Jong-Lam Lee
서명/저자  
Direct Evidence of Hole Injection Enhanced by O₂Plasma Treatment on Indium Tin Oxide / Soo Young Kim and Jong-Lam Lee
발행사항  
서울 : 대한금속재료학회, 2005.
형태사항  
pp. 59-62
기본자료저록  
ELECTRONIC MATERIALS Letters : Vol. 1 No. 1 2005, 11
모체레코드  
모체정보확인
Control Number  
kjul:60132186

MARC

 008100607s2005        ulka    a                          eng
■022    ▼a17388090
■1001  ▼aSoo  Young  Kim  and  Jong-Lam  Lee
■24510▼aDirect  Evidence  of  Hole  Injection  Enhanced  by  O₂Plasma  Treatment  on  Indium  Tin  Oxide▼dSoo  Young  Kim  and  Jong-Lam  Lee
■260    ▼a서울▼b대한금속재료학회▼c2005.
■300    ▼app.  59-62
■773    ▼tELECTRONIC  MATERIALS  Letters▼gVol.  1  No.  1▼d2005,  11
■SIS    ▼aS027262▼b60077032▼h8▼s2▼fP

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