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Characterization of ZnO : Al-Thin-Film-Passivated Porous Silicon
Characterization of ZnO : Al-Thin-Film-Passivated Porous Silicon
Detailed Information
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- Chongmu Lee.
- 서명/저자
- Characterization of ZnO : Al-Thin-Film-Passivated Porous Silicon / Chongmu Lee , Kyungha Kim , K. Prabakar.
- 발행사항
- 서울 : 한국물리학회, 2006.
- 형태사항
- pp. 1193-1198
- 기타저자
- Kyungha Kim
- 기타저자
- K. Prabakar.
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60096907
MARC
008070411s2006 ULKa a ENG■022 ▼a03744884
■1001 ▼aChongmu Lee.
■245 ▼aCharacterization of ZnO : Al-Thin-Film-Passivated Porous Silicon ▼dChongmu Lee▼eKyungha Kim▼eK. Prabakar.
■260 ▼a서울▼b한국물리학회▼c2006.
■300 ▼app. 1193-1198
■653 ▼aCHARACTERIZATION▼aZNO▼aALTHINFILMPASSIVATED▼aPOROUS▼aSILICON
■7001 ▼aKyungha Kim
■7001 ▼aK. Prabakar.
■773 ▼tJournal of The Korean Physical Society▼gVol. 48 No. 6 (2006. 6)▼d2006, 06
■URL ▼ahttp://www.kps.or.kr
■SIS ▼aS028403▼b60077342▼h8▼s2
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