서브메뉴
검색
Study of the Degradation of the Breakdown Voltage of a Super-Junction Power MOSFET due to Charge Imbalance
Study of the Degradation of the Breakdown Voltage of a Super-Junction Power MOSFET due to Charge Imbalance
상세정보
- 자료유형
- 기사
- ISSN
- 03744884
- 서명/저자
- Study of the Degradation of the Breakdown Voltage of a Super-Junction Power MOSFET due to Charge Imbalance / Pravine N. Kondekar 저 , Hwan-sool Oh , Young Beom Kim 공저
- 발행사항
- 서울 : 한국물리학회, 2006.
- 형태사항
- pp. 624-630
- 기타저자
- Oh, Hwan-sool
- 기타저자
- Kim, Young Beom
- Control Number
- kjul:60096681
MARC
008070406s2006 ULKa a ENG■022 ▼a03744884
■1001 ▼aKondekar, Pravine N.
■245 ▼aStudy of the Degradation of the Breakdown Voltage of a Super-Junction Power MOSFET due to Charge Imbalance▼dPravine N. Kondekar 저▼eHwan-sool Oh▼eYoung Beom Kim 공저
■260 ▼a서울▼b한국물리학회▼c2006.
■300 ▼app. 624-630
■653 ▼aSTUDY▼aDEGRADATION▼aBREAKDOWN▼aVOLTAGE▼aSUPERJUNCTION▼aPOWER▼aMOSFET▼aDUE▼aCHARGE▼aIMBALANCE
■7001 ▼aOh, Hwan-sool
■7001 ▼aKim, Young Beom
■773 ▼tJournal of The Korean Physical Society▼gVol. 48 No. 4 (2006. 4)▼d2006, 04
■■URL ▼ahttp://www.kps.or.kr
