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Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method
Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method
상세정보
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- Shin, Hui-youn
- 서명/저자
- Evaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method / Hui-youn Shin 저 , Y. I. Chang , Y. W. Jung , M. J. Cho , K. H. Park 공저
- 발행사항
- 서울 : 한국물리학회, 2006.
- 형태사항
- pp. 302-306
- 기타저자
- Chang, Y. I.
- 기타저자
- Jung, Y. W.
- 기타저자
- Cho, M. J.
- 기타저자
- Park, K. H.
- Control Number
- kjul:60096589
MARC
008070405s2006 ULKa a ENG■022 ▼a03744884
■1001 ▼aShin, Hui-youn
■245 ▼aEvaluation of the Localized Residual Strain States of GaN Layers by Using a TEM-CBED Method ▼dHui-youn Shin 저▼eY. I. Chang▼eY. W. Jung▼eM. J. Cho▼eK. H. Park 공저
■260 ▼a서울▼b한국물리학회▼c2006.
■300 ▼app. 302-306
■653 ▼aEVALUATION▼aLOCALIZED▼aRESIDUAL▼aSTRAIN▼aSTATES▼aGAN▼aLAYERS▼aUSING▼aTEMCBED▼aMETHOD
■7001 ▼aChang, Y. I.
■7001 ▼aJung, Y. W.
■7001 ▼aCho, M. J.
■7001 ▼aPark, K. H.
■773 ▼tJournal of The Korean Physical Society▼gVol. 48 No. 2 (2006. 2)▼d2006, 02
■■URL ▼ahttp://www.kps.or.kr
