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Development of a Two-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Development of a Two-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer
Detailed Information
- 자료유형
- 기사
- ISSN
- 03744884
- 저자명
- Park, Jinwon
- 서명/저자
- Development of a Two-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer / Jinwon Park 저 , Jaegun Jo , Sangho Byun , Jae Wan Kim , Tae Bong Eom , Cheon Il Eom 공저
- 발행사항
- 서울 : 한국물리학회, 2006.
- 형태사항
- pp. 28-32
- 키워드
- DEVELOPMENT TWODIMENSIONAL NANODISPLACEMENT MEASURING SYSTEM UTILIZING 2D COMBINED OPTICAL XRAY INTERFEROMETER
- 기타저자
- Jo,Jaegun
- 기타저자
- Byun, Sangho
- 기타저자
- Kim, Jae Wan
- 기타저자
- Eom, Tae Bong
- 기타저자
- Eom, Cheon Il
- Control Number
- kjul:60096498
MARC
008070404s2006 ULKa a ENG■022 ▼a03744884
■1001 ▼aPark, Jinwon
■245 ▼aDevelopment of a Two-Dimensional Nano-Displacement Measuring System Utilizing a 2D Combined Optical and X-ray Interferometer▼dJinwon Park 저▼eJaegun Jo▼eSangho Byun▼eJae Wan Kim▼eTae Bong Eom▼eCheon Il Eom 공저
■260 ▼a서울▼b한국물리학회▼c2006.
■300 ▼app. 28-32
■653 ▼aDEVELOPMENT▼aTWODIMENSIONAL▼aNANODISPLACEMENT▼aMEASURING▼aSYSTEM▼aUTILIZING▼a2D▼aCOMBINED▼aOPTICAL▼aXRAY▼aINTERFEROMETER
■7001 ▼aJo,Jaegun
■7001 ▼aByun, Sangho
■7001 ▼aKim, Jae Wan
■7001 ▼aEom, Tae Bong
■7001 ▼aEom, Cheon Il
■773 ▼tJournal of The Korean Physical Society▼gVol. 48 No. 1 (2006. 1)▼d2006, 01
■■URL ▼ahttp://www.kps.or.kr
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