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Analytical Thermal Noise Model of Deep-Submicron MOSFETs
Analytical Thermal Noise Model of Deep-Submicron MOSFETs
Detailed Information
- 자료유형
- 기사
- ISSN
- 15981657
- 저자명
- Hyungcheol Shin.
- 서명/저자
- Analytical Thermal Noise Model of Deep-Submicron MOSFETs / Hyungcheol Shin. , Seyoung Kim , Jongwook Jeon.
- 발행사항
- 서울 : 대한전자공학회, 2006.
- 형태사항
- pp. 206-209
- 기타저자
- Seyoung Kim
- 기타저자
- Jongwook Jeon.
- 기본자료저록
- Journal of Semiconductor Technology and Science : Volume 6, Number 3, (2006 September) 2006, 09
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60094049
MARC
008070320s2006 ULKa a ENG■022 ▼a15981657
■1001 ▼aHyungcheol Shin.
■245 ▼aAnalytical Thermal Noise Model of Deep-Submicron MOSFETs▼dHyungcheol Shin.▼eSeyoung Kim▼eJongwook Jeon.
■260 ▼a서울▼b대한전자공학회▼c2006.
■300 ▼app. 206-209
■653 ▼aANALYTICAL▼aTHERMAL▼aNOISE▼aMODEL▼aDEEPSUBMICRON▼aMOSFETS
■7001 ▼aSeyoung Kim
■7001 ▼aJongwook Jeon.
■773 ▼tJournal of Semiconductor Technology and Science▼gVolume 6, Number 3, (2006 September)▼d2006, 09
■SIS ▼aS034398▼b60054120▼h8▼s2
