서브메뉴
검색
Analytical Thermal Noise Model of Deep-Submicron MOSFETs
Analytical Thermal Noise Model of Deep-Submicron MOSFETs
Detailed Information
- Material Type
- 기사
- ISSN
- 15981657
- Author
- Hyungcheol Shin.
- Title/Author
- Analytical Thermal Noise Model of Deep-Submicron MOSFETs / Hyungcheol Shin. ; Seyoung Kim ; Jongwook Jeon.
- Publish Info
- 서울 : 대한전자공학회, 2006.
- Material Info
- pp. 206-209
- Index Term-Uncontrolled
- ANALYTICAL THERMAL NOISE MODEL DEEPSUBMICRON MOSFETS
- Added Entry-Personal Name
- Seyoung Kim
- Added Entry-Personal Name
- Jongwook Jeon.
- Host Item Entry
- Journal of Semiconductor Technology and Science : Volume 6, Number 3, (2006 September) 2006, 09
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60094049
MARC
008070320s2006 ULKa a ENG■022 ▼a15981657
■1001 ▼aHyungcheol Shin.
■245 ▼aAnalytical Thermal Noise Model of Deep-Submicron MOSFETs▼dHyungcheol Shin.▼eSeyoung Kim▼eJongwook Jeon.
■260 ▼a서울▼b대한전자공학회▼c2006.
■300 ▼app. 206-209
■653 ▼aANALYTICAL▼aTHERMAL▼aNOISE▼aMODEL▼aDEEPSUBMICRON▼aMOSFETS
■7001 ▼aSeyoung Kim
■7001 ▼aJongwook Jeon.
■773 ▼tJournal of Semiconductor Technology and Science▼gVolume 6, Number 3, (2006 September)▼d2006, 09
■SIS ▼aS034398▼b60054120▼h8▼s2
Preview
Export
ChatGPT Discussion
AI Recommended Related Books
Detail Info.
- Reservation
- Not Exist
- My Folder
- Reference Materials for Thesis Writing
- Reference Materials for Research Ethics
- Job-Related Books
