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Online experts screening the worst slicing machine ro control wafer yield via the analytic hierarchy process
Online experts screening the worst slicing machine ro control wafer yield via the analytic hierarchy process
Detailed Information
- 자료유형
- 기사
- ISSN
- 15982688
- 서명/저자
- Online experts screening the worst slicing machine ro control wafer yield via the analytic hierarchy process / Chin-Tsai Lin, Che-Wei Chang, Cheng-Ru Wu, Huang-Chu Chen by
- 발행사항
- 서울 : 한국품질경영학회, 2006.
- 형태사항
- pp. 141-156
- 키워드
- ONLINE EXPERTS SCREENING WORST SLICING MACHINE CONTROL WAFER YIELD VIA ANALYTIC HIERARCHY PROCESS
- 기타저자
- Lin, Chin-Tsai
- 기타저자
- Chang, Che-Wei
- 기타저자
- Wu, Cheng-Ru
- 기타저자
- Chen, Huang-Chu
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60083482
MARC
008061113s2006 ULKa a KOR■022 ▼a15982688
■245 ▼aOnline experts screening the worst slicing machine ro control wafer yield via the analytic hierarchy process▼dChin-Tsai Lin, Che-Wei Chang, Cheng-Ru Wu, Huang-Chu Chen by
■260 ▼a서울▼b한국품질경영학회▼c2006.
■300 ▼app. 141-156
■653 ▼aONLINE▼aEXPERTS▼aSCREENING▼aWORST▼aSLICING▼aMACHINE▼aCONTROL▼aWAFER▼aYIELD▼aVIA▼aANALYTIC▼aHIERARCHY▼aPROCESS
■7001 ▼aLin, Chin-Tsai
■7001 ▼aChang, Che-Wei
■7001 ▼aWu, Cheng-Ru
■7001 ▼aChen, Huang-Chu
■773 ▼tThe Asian Journal on Quality▼gVolume7 No.2 (2006)▼d2006, 09
■URL ▼ahttp://www.ksqm.org
■SIS ▼aS034323▼b60059648▼h8▼s2
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