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Characterization of BST Thin Films using MgO(100)Buffer Layer for Tunable Device
Characterization of BST Thin Films using MgO(100)Buffer Layer for Tunable Device
Detailed Information
- 자료유형
- 기사
- ISSN
- 12297607
- 서명/저자
- Characterization of BST Thin Films using MgO(100)Buffer Layer for Tunable Device / by Cheol-In Lee, Kyoung-Tae Kim, Chang-Il Kim
- 발행사항
- 서울 : 한국전기전자재료학회, 2006.
- 형태사항
- pp. 67-71
- 기타저자
- Cheol-In Lee
- 기타저자
- Kyoung-Tae Kim
- 기타저자
- Chang-Il Kim
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60078620
MARC
008060915s2006 ULKa a ENG■022 ▼a12297607
■245 ▼aCharacterization of BST Thin Films using MgO(100)Buffer Layer for Tunable Device▼dby Cheol-In Lee, Kyoung-Tae Kim, Chang-Il Kim
■260 ▼a서울▼b한국전기전자재료학회▼c2006.
■300 ▼app. 67-71
■653 ▼aCHARACTERIZATION▼aBST▼aFILMS▼aUSING▼aMGO100BUFFER▼aLAYER▼aTUNABLE▼aDEVICE
■700 ▼aCheol-In Lee
■7001 ▼aKyoung-Tae Kim
■7001 ▼aChang-Il Kim
■773 ▼tTransactions on Electrical and Electronic Materials▼gVol.7, No.2 (2006 April)▼d2006, 04
■URL ▼ahttp://kieeme.or.kr
■SIS ▼aS025128▼b60055341▼h8▼s2
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